Research line: Test and design for testability of integrated circuits and systems
Specific competencies: Ability to understand the problem of testing of integrated circuits and systems, derived from the complexity and characteristics of manufacture of such circuits. Ability to analyze and understand the benefits and limitations of existing test techniques. Ability to analyze and model the performance of analog circuits and systems, mixed signal, and radio frequency, to incorporate these models to the validation or definition of the testing flow of such circuits. Ability to address the challenges of improvements to existing test solutions. Ability to conceive and implement original solutions that expand the frontiers of knowledge in this research line. The ability to validate the proposed innovations in specific applications: telecommunications, biomedical, etc. Ability to transmit to the scientific and technical community the technological advances.
Training activities: the basic training activity is the continuous interaction between the student and its director or directors, completed in the writing and defense of the doctoral thesis. Also, regular meetings are held for students and teachers of the research line for the delivery of seminars by teachers and the presentation and discussion of student work. The training is complemented with the assistance, as a lecturer and as a listener, to international congresses related to the research line, as well as conferences and courses given by renowned researchers within the framework of the doctoral program.
Coordination activities: regular meetings of the teaching staff of the research line to organize research activity of the students working in this research line, as well as to monitor the individual evolution.They will also establish and updated the objectives of the research line.
Evaluation and rating systems: evaluation and rating will be made through the public defense of the Doctoral Thesis in accordance with current regulations of the University of Seville
Brief description of content: Concepts, terminology and foundations of the test and design for test. Variability and defects in integrated circuits and systems. Characterization techniques of analog and mixed signal integrated circuits. Generation and evaluation of test experiments. Acquisition and signal processing techniques. Functional test and structural test. Design for Testability (DfT) techniques. BIST (built-in self test) techniques. Problems of the test in SoC (System on chip) and in new systems implemented with emerging technologies.
